Large-area microfocal spectroscopic ellipsometry mapping of thickness and electronic properties of epitaxial graphene on Si- and C-face of 3C-SiC(111)
نویسندگان
چکیده
Vanya Darakchieva, A. Boosalis, A. A. Zakharov, T. Hofmann, M. Schubert, T. E. Tiwald, Tihomir Iakimov, Remigijus Vasiliauskas and Rositsa Yakimova, Large-area microfocal spectroscopic ellipsometry mapping of thickness and electronic properties of epitaxial graphene on Siand C-face of 3C-SiC(111), 2013, Applied Physics Letters, (102), 21, 213116. http://dx.doi.org/10.1063/1.4808379 Copyright: American Institute of Physics (AIP) http://www.aip.org/
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